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Resonant soft x-ray reflectivity of organic thin films Cheng Wang, Tohru Araki, and Benjamin Watts
 

Summary: Resonant soft x-ray reflectivity of organic thin films
Cheng Wang, Tohru Araki, and Benjamin Watts
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695
Shane Harton
Department of Materials Science and Engineering, North Carolina State University,
Raleigh, North Carolina 27695
Tadanori Koga
Chemical and Molecular Engineering Program, Department of Materials Science and Engineering,
Stony Brook University, Stony Brook, New York 11794-2275
Saibal Basu
Center of Neutron Research, National Institute of Standard and Technology, Gaithersburg, Maryland 20899
Harald Adea
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695
Received 8 December 2006; accepted 26 March 2007; published 23 April 2007
At photon energies close to absorption edges in the soft x-ray range, the complex index of refraction,
n=1- -i , of organic materials varies rapidly as a function of photon energy in a manner that
strongly depends on the chemical moieties and functionalities present in the material. The authors
present details of how these molecular structure specific variations in the complex index of
refraction can be utilized to enhance and tune the contrast in reflectivity experiments of organic
films. This near edge contrast enhancement mimics the specific contrast achieved through deuterium

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics