| | |
Summary: 134 IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, VOL. 4, NO. 2, MAY 2008
Analysis and Simulation of Jitter Sequences
for Testing Serial Data Channels
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Senior Member, IEEE, and Fabrizio Lombardi, Senior Member, IEEE
Abstract--This paper presents a novel modeling analysis of jitter
as applicable to testing of serial data channels. Jitter is analyzed
by considering separate and combined components. The primary
goal is the generation of a signal containing a known amount of
each jitter component. This signal can then be used for testing high
speed serial data channels. Initially, jitter components are analyzed
and modeled individually. Next, sequences for combining them are
modeled, simulated and evaluated. Model simulation using Matlab
is utilized to show the unique features of the components when they
are combined into different injection sequences for producing the
total jitter. Sequence dependency is investigated in depth and the
validity of superposition of jitter components for typical values is
confirmed. A good agreement between theory and simulation is
verified; these results allow test engineers to have an insight into
the interactions among jitter components in serial data channels.
Index Terms--Duty cycle distortion, intersymbol interference,
|
