Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
VOLUME 83, NUMBER 20 P H Y S I C A L R E V I E W L E T T E R S 15 NOVEMBER 1999 Stability of Straight Delamination Blisters
 

Summary: VOLUME 83, NUMBER 20 P H Y S I C A L R E V I E W L E T T E R S 15 NOVEMBER 1999
Stability of Straight Delamination Blisters
Basile Audoly
Laboratoire de Physique Statistique de l'École Normale Supérieure, 24 rue Lhomond, 75230 Paris Cedex 05, France
(Received 2 July 1999)
We consider the buckle-driven delamination of biaxially compressed thin films. Telephone-cord-like
patterns observed in experiments are explained as a result of the buckling behavior of the film. We
perform a stability analysis of a straight blister. A mechanism of instability causing undulations in an
advancing finger of delamination is pointed out, which we claim to be the basic phenomenon explaining
the zigzag pattern. We predict a transition to a varicose (unobserved as yet) pattern at low Poisson
ratios.
PACS numbers: 68.55.-a, 46.32.+x
The elasticity of thin plates has been investigated by
Föppl and von Kármán (FvK) early in this century.
Because of the intricate nature of the equations, however,
there remain many unsolved theoretical questions in this
area. For example, thin films delamination is still poorly
understood, although such films are widely used in the
industry (e.g., insulating layers in microelectronics). A
thin coated film is often obtained by vapor deposition

  

Source: Audoly, Basile - Institut Jean Le Rond D'Alembert, Université Pierre-et-Marie-Curie, Paris 6

 

Collections: Materials Science; Physics