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IOP PUBLISHING JOURNAL OF PHYSICS: CONDENSED MATTER J. Phys.: Condens. Matter 19 (2007) 473201 (33pp) doi:10.1088/0953-8984/19/47/473201
 

Summary: IOP PUBLISHING JOURNAL OF PHYSICS: CONDENSED MATTER
J. Phys.: Condens. Matter 19 (2007) 473201 (33pp) doi:10.1088/0953-8984/19/47/473201
TOPICAL REVIEW
Measurement and interpretation of elastic and
viscoelastic properties with the atomic force microscope
Phil Attard
School of Chemistry F11, University of Sydney, NSW 2006, Australia
Received 23 September 2007
Published 1 November 2007
Online at stacks.iop.org/JPhysCM/19/473201
Abstract
This review focuses upon the measurement of force, indentation, and
deformation with the atomic force microscope (AFM). Measurement and theory
for elastic and viscoelastic particles and substrates are covered, as well as for
deformable fluid drops and bubbles. A brief review is given of papers that use
tapping mode imaging, normal and lateral force modulation, noise spectra, and
indentation measurements. Measurement and calibration techniques that are
essential for quantitative results with the AFM are discussed in detail. The
author's contribution to elastic and viscoelastic theory for extended range forces
is outlined, and the application of these to measured data for the adhesive van

  

Source: Attard, Phil - School of Chemistry, University of Sydney

 

Collections: Chemistry