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Soft x-ray resonant reflectivity of low-Z material thin films Cheng Wang, T. Araki, and H. Adea
 

Summary: Soft x-ray resonant reflectivity of low-Z material thin films
Cheng Wang, T. Araki, and H. Adea
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695
Received 20 September 2005; accepted 19 October 2005; published online 17 November 2005
Soft x-ray resonant reflectivity, a method for low-Z materials that combines aspects of neutron
reflectivity and x-ray reflectivity, is presented. Resonant reflectivity provides enhanced and selective
sensitivity to specific chemical moieties near the absorption edges of constituent elements and was
demonstrated through the characterization of a bilayer polymer thin film. The relative reflectivity of
a particular interface could be tuned by adjusting the incident photon energy near the carbon 1s
absorption edge. The resulting chemical specificity is analogous to using deuteration as a tracer or
marker in neutron reflectivity, but without requiring special sample synthesis or preparation. 2005
American Institute of Physics. DOI: 10.1063/1.2136353
Neutron reflectivity NR and x-ray reflectivity XR are
well established complementary research tools to character-
ize important parameters of hard- and soft-condensed matter
films such as film thickness, interfacial width, diffusion pro-
files, and surface roughness.14
Applications range from
polymer thin films, to biomembranes, magnetic multilayers
and oxide thin films. The relative availability of NR and XR

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics