Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and
 

Summary: Carbon-13 Labeled Polymers: An Alternative
Tracer for Depth Profiling of Polymer Films and
Multilayers Using Secondary Ion Mass
Spectrometry
S. E. Harton, F. A. Stevie, Z. Zhu, and H. Ade*,
Department of Materials Science & Engineering, Analytical Instrumentation Facility, and Department of Physics,
North Carolina State University, Raleigh, North Carolina 27695
13C labeling is introduced as a tracer for depth profiling
of polymer films and multilayers using secondary ion
mass spectrometry (SIMS). Deuterium substitution has
traditionally been used in depth profiling of polymers but
can affect the phase behavior of the polymer constituents
with reported changes in both bulk-phase behavior and
surface and interfacial interactions. SIMS can provide
contrast by examining various functional groups, chemical
moieties, or isotopic labels. 13C-Labeled PS (13C-PS) and
unlabeled PS (12C-PS) and PMMA were synthesized using
atom-transfer radical polymerization and assembled in
several model thin-film systems. Depth profiles were
recorded using a Cameca IMS-6f magnetic sector mass

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics