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Bulk and surface characterization of a dewetting thin film polymer bilayer H. Ade, D. A. Winesett, and A. P. Smith
 

Summary: Bulk and surface characterization of a dewetting thin film polymer bilayer
H. Ade, D. A. Winesett, and A. P. Smith
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695-8202
S. Anders, T. Stammler, and C. Heske
Advanced Light Source, Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, California 94720
D. Slep
Advanced Development and Research, Hilord Chemical Corporation, Hauppauge, New York 11788
M. H. Rafailovich and J. Sokolov
Department Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, New York 11794
J. Sto¨hr
IBM Research Division, Almaden Research Center, San Jose, California 95120
Received 15 June 1998; accepted for publication 14 October 1998
We have monitored the progression of the dewetting of a partially brominated polystyrene PBrS
thin film on top of a polystyrene PS thin film with scanning transmission x-ray microscopy
STXM as well as photoemission electron microscopy PEEM . We mapped the projected
thickness of each constituent polymer species and the total thickness of the film with STXM, while
we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes
encapsulated during the later stages of dewetting and that atomic force microscopy topographs
cannot be utilized to determine the contact angle between PBrS and PS. © 1998 American Institute
of Physics. S0003-6951 98 02351-1

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics