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Quantitative orientational analysis of a polymeric material (Kevlar with x-ray microspectroscopy

Summary: Quantitative orientational analysis of a polymeric material (Kevlar®
with x-ray microspectroscopy
A. P. Smith and H. Adea)
Department of Physics, North Carolina State University, Raleigh, North Carolina 27695-8202
Received 12 August 1996; accepted for publication 14 October 1996
It has previously been shown that x-ray linear dichroism microscopy can be utilized to image and
determine orientation in a polymeric material at high spatial resolution. We have now expanded on
this technique and extracted quantitative information about the orientation of specific functional
groups in a polymeric system from submicron areas. This is accomplished by acquiring and
analyzing spectral data sets rather than just images at specific energies. It has allowed us to compare
the relative lateral orientation of various grades of Kevlar®
fibers. © 1996 American Institute of
Physics. S0003-6951 96 02951-8
Near edge x-ray absorption fine structure NEXAFS
spectroscopy has proven to be a valuable tool to study the
electronic structure of a variety of materials, both in the bulk
and near surfaces.1
This electronic structure is directly linked
to the chemical bonding of the materials investigated and


Source: Ade, Harald W.- Department of Physics, North Carolina State University


Collections: Physics