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Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects
 

Summary: Inherited Redundancy and Configurability Utilization for
Repairing Nanowire Crossbars with Clustered Defects
Yadunandana Yellambalase1
, Minsu Choi1
and Yong-Bin Kim2
1
Dept of ECE, University of Missouri-Rolla, Rolla, MO 65409-0040, USA
{ypymy9, choim}@umr.edu
2
Dept of ECE, Northeastern University, Boston, MA 02115, USA
ybk@ece.neu.edu
Abstract
With the recent development of nanoscale materials and assembly techniques, it is envi-
sioned to build high-density reconfigurable systems which have never been achieved by the
photolithography. Various reconfigurable architectures have been proposed based on nanowire
crossbar structure as the primitive building block. Unfortunately, high-density systems con-
sisting of nanometer-scale elements are likely to have many imperfections and variations;
thus, defect-tolerance is considered as one of the most exigent challenges. In this paper,
we evaluate three different logic mapping algorithms with defect avoidance to circumvent
clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The ef-

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering