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Int. J. Nanomanufacturing, Vol. 6, Nos. 1/2/3/4, 2010 279 Copyright 2010 Inderscience Enterprises Ltd.
 

Summary: Int. J. Nanomanufacturing, Vol. 6, Nos. 1/2/3/4, 2010 279
Copyright 2010 Inderscience Enterprises Ltd.
Scanning probe recognition microscopy investigation
of neural cell prosthetic properties
Virginia M. Ayres*, Qian Chen and Yuan Fan
Department of Electrical and Computer Engineering,
Michigan State University,
East Lansing, MI 48824, USA
E-mail: ayresv@msu.edu
E-mail: chenqia2@gmail.com
E-mail: fanywx@gmail.com
*Corresponding author
Dexter A. Flowers
Department of Electrical and Computer Engineering,
Wayne State University,
5050 Anthony Wayne Drive, Detroit, MI 48202, USA
E-mail: ay2028@wayne.edu
Sally A. Meiners and Ijaz Ahmed
University of Medicine and Dentistry of New Jersey,
675 Hoes Lane, Piscataway, NJ 08854, USA

  

Source: Ayres, Virginia - Department of Electrical and Computer Engineering, Michigan State University

 

Collections: Materials Science; Biology and Medicine