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Summary: Optimization of the tunability of barium strontium titanate films
via epitaxial stresses
Z.-G. Ban and S. P. Alpaya)
Department of Metallurgy and Materials Engineering and Institute of Materials Science,
University of Connecticut, Storrs, Connecticut 06269
Received 2 July 2002; accepted 6 October 2002
The tunability of epitaxial barium strontium titanate films is analyzed theoretically using a
phenomenological model. The relative dielectric constant of Ba0.5Sr0.5TiO3 BST 50/50 films as a
function of the applied external electric field is calculated and an electric fieldmisfit strain phase
diagram is developed to assist in the interpretation of the behavior. On the basis of these results, the
tunability of BST 50/50 films as a function of the misfit strain is provided and compared with the
experimental data in the literature. Analysis shows that a high tunability can be achieved by
adjusting the misfit strain especially in the vicinity of a structural phase transformation. The misfit
strain in epitaxial films can be controlled with the selection of a substrate material or variations in
the film thickness. The film thickness dependence is due to misfit dislocation formation at the film
growth temperature. A critical thickness to attain the maximum tunability can be defined for BST
50/50 films on MgO 90 nm and LaAlO3 120 nm substrates. It is suggested that the selection
of the substrate and/or the film thickness can be chosen as design parameters to manipulate the strain
state in the film to achieve optimum tunability. © 2003 American Institute of Physics.
DOI: 10.1063/1.1524310
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