Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
IMTC 2004 -Instrumentation and Measurement Technology Conference
 

Summary: IMTC 2004 - Instrumentation and Measurement
Technology Conference
Como, Italy, May 1820, 2004
Off-Device Fault Tolerance for Digital Imaging Devices
B. Jin, T. Feng , N.-J. Park, K.M. George, N. Park
Department of Computer Science
Oklahoma State University, Stillwater, OK 74078-1053
npark@cs.okstate.edu
F. Lombardi, Y.B. Kim
Department of Electrical and Computer Engineering
Northeastern University, Boston, MA 02115
lombardi@ece.neu.edu
Abstract Charge-Coupled Device (CCD) is one of the widely-used optical
sensing device technologies for various digital imaging systems such as digi-
tal cameras, digital camcorders and digital x-ray imaging systems. Pixels on
a CCD may suffer from defective or faulty pixels due to numerous causes such
as imperfect fabrication, excessive exposure to light, radiation and sensing el-
ement aging to mention a few. As the use of high-resolution CCDs increase,
defect and fault tolerance of such devices demands immediate attention. In this
context, this paper proposes a testing and repair technique for defects/faults

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering