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Electronic spectroscopy of oxygen atoms trapped in solid xenon W. G. Lawrence and V. A. Apkarian
 

Summary: Electronic spectroscopy of oxygen atoms trapped in solid xenon
W. G. Lawrence and V. A. Apkarian
Department of Chemistry, University of California, Irvine, California 92717
(Received 16 March 1992;accepted28 August 1992)
The electronic spectroscopyof oxygen atoms trapped in solid xenon are reported. Excitation
of the solid between220 and 260 nm leadsto two main emissionscenteredat 3.35 and
1.65eV, both of which arise from the sameupper state.The excitations are assignedto charge-
transfer absorptionsin interstitial Oh sites; the emitting state, which has a lifetime of 227
ns, is assignedto Xe+O- (`xc+). An avoided crossing between the ionic and covalent Ix+
states,and differential solvation of these states,explains the main trends of the
spectroscopyof XeO in the gasand condensedphases.Implications regarding ionic and
-covalent many-body surfacesare discussed.
I. INTRODUCTION
The electronic spectroscopyof atomic impurities iso-
lated in crystalline rare-gassolids can be usedto probe the
many-body potentials that are, in principle, related to the
guest-hostpair potentials. For weakly interacting systems,
reliable constructs for developingmany-bodysurfacesfrom
known pair potentials would be highly useful in dynamical
studies. In the ground electronic state, the interaction be-

  

Source: Apkarian, V. Ara - Department of Chemistry, University of California, Irvine

 

Collections: Chemistry