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Summary: Allen, Sumali & Penegor Page 1 of 23 Draft Manuscript for DMCMN
Submitted to Special Issue on Dynamic Modeling, Control, and Manipulation at the Nanoscale
DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on
Atomic Force Microscope Cantilever Calibration
Matthew S. Allen*
, Hartono Sumali§
& Peter C. Penegor+
*
Assistant Professor, University of Wisconsin-Madison, 535 ERB, 1500 Engineering Drive, Madison, WI 53706,
Corresponding Author: msallen@engr.wisc.edu
§
Principal Member of Technical Staff, Sandia National Laboratories1
P.O. Box 5800, Albuquerque, NM 87185,
hsumali@sandia.gov
+
Undergraduate Student, University of Wisconsin-Madison
Abstract:
Quantitative studies of material properties and interfaces using the Atomic Force Microscope (AFM) have
important applications in engineering, biotechnology and chemistry. Contrary to what the name suggests, the
AFM actually measures the displacement of a micro-scale probe, so one must determine the stiffness of the
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