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J Electron Test (2008) 24:271284 DOI 10.1007/s10836-007-5016-4
 

Summary: J Electron Test (2008) 24:271284
DOI 10.1007/s10836-007-5016-4
Monomer Control for Error Tolerance
in DNA Self-Assembly
Byunghyun Jang Yong-Bin Kim Fabrizio Lombardi
Received: 14 November 2006 / Accepted: 18 June 2007 / Published online: 4 January 2008
Springer Science + Business Media, LLC 2007
Abstract This paper proposes the control of monomer
concentration as a novel improvement of the kinetic
Tile Assembly Model (kTAM) to reduce the error
rate in DNA self-assembly. Tolerance to errors in this
process is very important for manufacturing scaffolds
for highly dense ICs; the proposed technique signifi-
cantly decreases error rates (i.e. it increases error toler-
ance) by controlling the concentration of the monomers
(tiles) for a specific pattern to be assembled. By profil-
ing, this feature is shown to be applicable to different
tile sets. A stochastic analysis based on a new state
model is presented. The analysis is extended to the
cases of single, double and triple bondings. The kinetic

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering