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Integrated Ferroelectrics, 71: 6780, 2005 Copyright Taylor & Francis Inc.

Summary: Integrated Ferroelectrics, 71: 6780, 2005
Copyright Taylor & Francis Inc.
ISSN 1058-4587 print / 1607-8489 online
DOI: 10.1080/10584580590964709
Strong Degradation of Physical Properties and
Formation of a Dead Layer in Ferroelectric Films
Due to Interfacial Dislocations
I. B. Misirlioglu, A. L. Vasiliev, M. Aindow, and S. P. Alpay
Department of Metallurgy and Materials Engineering and Institute
of Materials Science, University of Connecticut, Storrs, CT 06269
Dislocations are the most common type of secondary defects and are unavoidably present
in all crystalline materials. They have been observed in ferroelectric materials as in many
other materials systems. Experiments have shown that they may have a significant impact
on the degradation of the electrical properties and may change phase transition charac-
teristics in epitaxial ferroelectric thin films. In this study, we provide a general overview
of experimental observations combined with a preliminary thermodynamic analysis.
Keywords: Ferroelectric thin films; dislocations; TEM; thermodynamics; polarization
The effects of microstructural features such as grain boundaries and structural


Source: Alpay, S. Pamir - Department of Materials Science and Engineering, University of Connecticut


Collections: Materials Science