Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
SIMS depth profiling of deuterium labeled polymers in polymer multilayers
 

Summary: SIMS depth profiling of deuterium labeled
polymers in polymer multilayers
Shane E. Harton a,*, Fred A. Stevie b
, Dieter P. Griffis a,b
, Harald Ade c
a
Department of Materials Science & Engineering, Box 7907, North Carolina State University, Raleigh, NC 27695, USA
b
Analytical Instrumentation Facility, Box 7531, North Carolina State University, Raleigh, NC 27695, USA
c
Department of Physics, North Carolina State University, Box 8202, Raleigh, NC 27695, USA
Received 12 September 2005; accepted 15 February 2006
Available online 19 May 2006
Abstract
Thin planar polymer films are model systems for probing physical phenomena related to molecular confinement at polymer surfaces and polymer/
polymer interfaces. Existing experimental techniques such as forward recoil spectrometry (FRES) and neutron reflectometry (NR) have been used
extensively for analysis of these systems, although they suffer from relatively low depth resolution (FRES) or difficulties associated with inversion to
real space (NR). In contrast, secondary ion mass spectrometry (SIMS) can provide real-space depth profiles of tracer labeled polymers directly with
sufficient depth resolution for optimal analyses of these systems. Deuterated polystyrene (dPS) has been employed as the tracer polymer and has been
embedded in a matrix of either unlabeled polystyrene (PS) or poly(cyclohexyl methacrylate) (PCHMA). These doped films have been placed on either

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics