| | |
Summary: Journal of Superconductivity and Novel Magnetism, Vol. 19, Nos. 78, November 2006 ( C 2006)
DOI: 10.1007/s10948-006-0123-5
Microwave Current Imaging in Passive HTS Components by
Low-Temperature Laser Scanning Microscopy (LTLSM)
A. P. Zhuravel,1 Steven M. Anlage,2 and A. V. Ustinov3
Published online: 30 September 2006
We have used the Low-Temperature Laser Scanning Microscope (LTLSM) technique for
a spatially resolved investigation of the microwave transport properties, nonlinearities, and
material inhomogeneities in an operating coplanar waveguide YBa2Cu3O7- (YBCO) mi-
crowave resonator on a LaAlO3 (LAO) substrate. The influence of twin-domain blocks,
in-plane rotated grains, and micro-cracks in the YBCO film on the nonuniform radiofre-
quency (rf) current distribution was measured with a micrometer-scale spatial resolution.
The impact of the peaked edge currents and rf field penetration into weak links on the linear
device performance were also studied. The LTLSM capabilities and its future potential for
nondestructive characterization of the microwave properties of superconducting circuits are
discussed.
KEY WORDS: high-temperature superconductor; microwave device; nonlinear response; laser scan-
ning microscopy.
1. INTRODUCTION
Thin-film devices made from high-Tc supercon-
|
