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PHD DISSERTATION DEFENSE Mr. Yuan Fan
 

Summary: PHD DISSERTATION DEFENSE
Mr. Yuan Fan
Advisor: Dr. Lalita Udpa
Co-Advisor: Dr. Virginia Ayres
Department of Electrical & Computer Engineering
Michigan State University
Friday, November 16, 2007
10:00 AM 12:00 PM
2219 Engineering Building
"IMAGE PROCESSING ENHANCEMENTS FOR SCANNING PROBE RECOGNITION
MICROSCOPY"
ABSTRACT
The family of scanning probe microscopy (SPM) techniques has revolutionized studies of micro and nano objects.
Nanobiology is one field which is being dramatically impacted by the newly available direct information provided by
SPM techniques. Although SPM has great potential in nanobiology, it is important to realize that it also has challenges:
image artifacts; slow scanning speed; difficulty in efficient recognition of the region of interest; optimization of
scanning parameters. A new mode of SPM operation, Scanning Probe Recognition Microscopy (SPRM), has been
developed by our group in partnership with Veeco Instruments Inc. Scanning Probe Recognition Microscopy is a new
scanning probe microscopy technique which allows us to adaptively track individual structures using a fine resolution
scan restricted to the region of interest, and providing statistically significant data for multiple properties. Two

  

Source: Ayres, Virginia - Department of Electrical and Computer Engineering, Michigan State University

 

Collections: Materials Science; Biology and Medicine