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Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of

Summary: Near-Edge X-ray Absorption Fine Structure Spectroscopy
on Ordered Films of an Amphiphilic Derivate of
R. Giebler,,| B. Schulz, J. Reiche, L. Brehmer, M. Wušhn, Ch. Wošll,
A. P. Smith,§ S. G. Urquhart,§ H. W. Ade,§ and W. E. S. Unger*,|
Universitašt Potsdam, Lehrstuhl fušr Physik der kondensierten Materie, Postfach 601553,
D-14415 Potsdam, Germany, Ruhr-Universitašt Bochum, Lehrstuhl fušr Physikalische Chemie I,
D-44780 Bochum, Germany, Physics Department, North Carolina State University, Box 8202,
Raleigh, North Carolina 27695, and Bundesanstalt fušr Materialforschung und -prušfung,
Lab. VIII.23, Unter den Eichen 44-46, D-12203 Berlin, Germany
Received July 14, 1998. In Final Form: November 19, 1998
The surfaces of ordered films formed from an amphiphilic derivative of 2,5-diphenyl-1,3,4-oxadiazole
by the use of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. For the assignment of
the spectral features of the C, N, and O K-edge absorption spectra, fingerprint spectra of poly(p-phenylene
terephthalamide) (Kevlar), poly(ethylene terephthalate), poly(p-phenylene-1,3,4-oxadiazole), and 2,5-di-
(pentadecyl)-1,3,4-oxadiazole, which contain related chemical moieties, were recorded. Ab initio molecular
orbital calculations, performed with explicit treatment of the core hole, are used to support the spectral
interpretations. Angle-resolved NEXAFS spectroscopy at the C, N, and O K-edges suggests a preferentially
upright orientation of the oxadiazole derivative in the outermost layer of the films. X-ray specular reflectivity


Source: Ade, Harald W.- Department of Physics, North Carolina State University


Collections: Physics