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Accepted Manuscript Title: Multiple Scattering Causes the Low EnergyLow Angle
 

Summary: Accepted Manuscript
Title: Multiple Scattering Causes the Low Energy­Low Angle
Constant Wavelength Topographical Instability of Argon Ion
Bombarded Silicon surfaces
Authors: Charbel S. Madi, Michael J. Aziz
PII: S0169-4332(11)01226-8
DOI: doi:10.1016/j.apsusc.2011.07.143
Reference: APSUSC 22249
To appear in: APSUSC
Received date: 10-4-2011
Revised date: 14-7-2011
Accepted date: 31-7-2011
Please cite this article as: C.S. Madi, M.J. Aziz, Multiple Scattering Causes
the Low Energy­Low Angle Constant Wavelength Topographical Instability
of Argon Ion Bombarded Silicon surfaces, Applied Surface Science (2010),
doi:10.1016/j.apsusc.2011.07.143
This is a PDF file of an unedited manuscript that has been accepted for publication.
As a service to our customers we are providing this early version of the manuscript.
The manuscript will undergo copyediting, typesetting, and review of the resulting proof
before it is published in its final form. Please note that during the production process

  

Source: Aziz, Michael J.- School of Engineering and Applied Sciences, Harvard University

 

Collections: Physics; Materials Science