Summary: Accepted Manuscript
Title: Multiple Scattering Causes the Low Energy­Low Angle
Constant Wavelength Topographical Instability of Argon Ion
Bombarded Silicon surfaces
Authors: Charbel S. Madi, Michael J. Aziz
PII: S0169-4332(11)01226-8
DOI: doi:10.1016/j.apsusc.2011.07.143
Reference: APSUSC 22249
To appear in: APSUSC
Received date: 10-4-2011
Revised date: 14-7-2011
Accepted date: 31-7-2011
Please cite this article as: C.S. Madi, M.J. Aziz, Multiple Scattering Causes
the Low Energy­Low Angle Constant Wavelength Topographical Instability
of Argon Ion Bombarded Silicon surfaces, Applied Surface Science (2010),
doi:10.1016/j.apsusc.2011.07.143
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Source: Aziz, Michael J.- School of Engineering and Applied Sciences, Harvard University

Collections: Physics; Materials Science