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Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopes
 

Summary: Calibration of the torsional spring constant and the lateral photodiode
response of frictional force microscopes
Adam Feiler, Phil Attard, and Ian Larsona)
Ian Wark Research Institute, University of South Australia, Mawson Lakes, SA 5095 Australia
Received 29 December 1999; accepted for publication 24 March 2000
We present a direct one-step technique to measure the torsional spring constant of cantilevers used
for lateral or friction measurements with the atomic force microscope. The method simultaneously
calibrates the photodiode response to the angular deflection of the cantilever. It does not rely upon
any approximate theory for friction, nor upon any simplified model cantilever geometry or elasticity.
The technique is verified by comparison with the calculated spring constant and with an independent
measurement of the angle calibration. This nondestructive calibration may be performed with any
type of cantilever, and the friction may subsequently be measured with any type of substrate or
probe. 2000 American Institute of Physics. S0034-6748 00 01507-0
I. INTRODUCTION
The quantitative measurement of friction with an atomic
force microscope AFM or friction force microscope FFM ,
in general involves two steps: the calibration of the lateral
photodiode response to convert the measured volts to the
angle of twist of the cantilever, and the measurement of the
angular spring constant of the cantilever, which converts

  

Source: Attard, Phil - School of Chemistry, University of Sydney

 

Collections: Chemistry