Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
IOP PUBLISHING SEMICONDUCTOR SCIENCE AND TECHNOLOGY Semicond. Sci. Technol. 23 (2008) 055001 (6pp) doi:10.1088/0268-1242/23/5/055001
 

Summary: IOP PUBLISHING SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Semicond. Sci. Technol. 23 (2008) 055001 (6pp) doi:10.1088/0268-1242/23/5/055001
Dielectric function of cubic InN from the
mid-infrared to the visible spectral range
P Schley1, R Goldhahn1, C Napierala1, G Gobsch1, J Sch¨ormann2,
D J As2, K Lischka2, M Feneberg3 and K Thonke3
1
Institute of Physics and Institute of Micro- and Nanotechnologies, Technical University of Ilmenau,
PF 100565, 98684 Ilmenau, Germany
2
Department of Physics, University of Paderborn, Warburger Straße 100, 33098 Paderborn, Germany
3
Institute of Semiconductor Physics, University of Ulm, 89069 Ulm, Germany
E-mail: pascal.schley@tu-ilmenau.de
Received 13 November 2007, in final form 17 January 2008
Published 26 March 2008
Online at stacks.iop.org/SST/23/055001
Abstract
The complex dielectric function for cubic InN is determined by spectroscopic ellipsometry
from the mid-infrared into the visible spectral region. Films were grown by molecular beam

  

Source: As, Donat Josef - Department Physik, Universität Paderborn

 

Collections: Materials Science; Physics