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Assessment of CNTFET Based Circuit Performance and Robustness to PVT Variations
 

Summary: Assessment of CNTFET Based Circuit Performance
and Robustness to PVT Variations
Geunho Cho, Yong-Bin Kim
Department of Electrical and Computer Engineering
Northeastern University
Boston, MA, USA
{gcho, ybk}@ece.neu.edu
Fabrizio Lombardi
Department of Electrical and Computer Engineering
Northeastern University
Boston, MA, USA
lombardi@ece.neu.edu
Abstract-- Carbon nanotubes (CNTs) have superior transport
properties, excellent thermal conductivity, and high current
handling capability; recently the CNT has been proposed as an
alternative device technology to supersede CMOS. In this paper,
the circuit-level performance of CNT-based FETs (CNTFETs) is
initially compared to MOSFETs; simulation is performed for
various logic gates and benchmark circuits to assess the
sensitivity to PVT variations using the same minimum gate length.

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering