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J. Adhesion Sci. Technol., Vol. 18, No. 10, pp. 11991215 (2004) Also available online -www.vsppub.com
 

Summary: J. Adhesion Sci. Technol., Vol. 18, No. 10, pp. 11991215 (2004)
VSP 2004.
Also available online - www.vsppub.com
Analysis of atomic force microscopy data for deformable
materials
MARK W. RUTLAND
, JAMES W. G. TYRRELL and PHIL ATTARD
School of Chemistry F11, University of Sydney, Sydney, NSW 2006, Australia
Received in final form 31 May 2004
Abstract--A protocol for measuring the interaction, deformation and adhesion of soft polymeric
substrates with the atomic force microscope (AFM) is described. The technique obtains the
photodiode response of the AFM (constant compliance factor) by independent calibration against
the rigid substrate adjacent to the deformable particle or patchy film. The zero of separation is taken
as the end-point of the jump into contact. A method is given for correcting the velocity dependence
of the piezodrive expansion factor, the neglect of which will cause artefacts in dynamic viscoelastic
measurements. It is emphasised that conventional force curve analysis, which uses the apparently
linear large force region for calibration, will generate erroneous results for deformable substrates.
Results are obtained for cellulose particles and for polystyrene films, and their Young's moduli are
found to be 22 MPa and 100 MPa, respectively. The latter is about a factor of 30 less than for bulk
polystyrene, which indicates that the polystyrene surface is in a less glassy state than the bulk.

  

Source: Attard, Phil - School of Chemistry, University of Sydney

 

Collections: Chemistry