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A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes
 

Summary: A guided mode view on Near-field Scanning Optical Microscopy measurements
of optical magnetic fields with slit probes
Remco Stoffer1
, Manfred Hammer2
, O.V. (Alyona) Ivanova2
and Hugo J.W.M. Hoekstra2
1
PhoeniX Software, P.O. Box 545, 7521PA Enschede, The Netherlands
remco.stoffer@phoenixbv.com
2
MESA+ Institute for Nanotechnology, Univ. of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands
Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to
measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations
can also be explained by mode overlap calculations.
Summary
Measurements [1] of electromagnetic fields around an optical waveguide, by means of Near-field
Scanning Optical Microscopy (NSOM) with a metal-coated tapered fiber tip with a slit in the
coating, seem to indicate that the in-plane electric and out-of-plane magnetic components of the
optical field can be determined independently. We consider the structure shown in Figure 1(a) as a
simplification of the configuration of [1]. The probe is assumed to be purely cylindrical; any effects

  

Source: Al Hanbali, Ahmad - Department of Applied Mathematics, Universiteit Twente
Hammer, Manfred - Department of Applied Mathematics, Universiteit Twente

 

Collections: Engineering; Mathematics