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Near-field microwave microscope with improved sensitivity and spatial resolution
 

Summary: Near-field microwave microscope with improved sensitivity
and spatial resolution
Alexander Tseleva)
and Steven M. Anlageb)
MRSEC and Center for Superconductivity Research, Physics Department, University of Maryland,
College Park, Maryland 20742-4111
Hans M. Christen
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
Robert L. Moreland, Vladimir V. Talanov,a)
and Andrew R. Schwartz
Neocera, Inc., 10000 Virginia Manor Road, Suite 300, Beltsville, Maryland 20705-4215
Received 1 October 2002; accepted 21 February 2003
The near-field scanning microwave microscope has become a popular instrument to quantitatively
image high-frequency properties of metals and dielectrics on length scales far shorter than the
wavelength of the radiation. We have developed several new ways to operate this microscope to
dramatically improve its spatial resolution and material property sensitivity. These include a novel
distance-following method that takes advantage of the stability of a synthesized microwave source
to improve the signal-to-noise ratio of our earlier frequency-following imaging technique. We also
discuss novel height-modulated imaging techniques, culminating in a new tapping-mode method,
which makes a 14 dB improvement in sensitivity, a 17.5 dB improvement in signal-to-noise ratio,

  

Source: Anlage, Steven - Center for Superconductivity Research & Department of Physics, University of Maryland at College Park

 

Collections: Materials Science