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Characterization of fluctuations of impedance and scattering matrices in wave chaotic scattering Xing Zheng, Sameer Hemmady,* Thomas M. Antonsen, Jr.,* Steven M. Anlage,* and Edward Ott*
 

Summary: Characterization of fluctuations of impedance and scattering matrices in wave chaotic scattering
Xing Zheng, Sameer Hemmady,* Thomas M. Antonsen, Jr.,* Steven M. Anlage,* and Edward Ott*
Department of Physics, University of Maryland, College Park, Maryland, 20742, USA
and Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, USA
Received 17 June 2005; published 25 April 2006
In wave chaotic scattering, statistical fluctuations of the scattering matrix S and the impedance matrix Z
depend both on universal properties and on nonuniversal details of how the scatterer is coupled to external
channels. This paper considers the impedance and scattering variance ratios, z and s, where z
=Var Zij / Var Zii Var Zjj
1/2
, s=Var Sij / Var Sii Var Sjj
1/2
, and Var denotes variance. z is shown to
be a universal function of distributed losses within the scatterer. That is, z is independent of nonuniversal
coupling details. This contrasts with s for which universality applies only in the large loss limit. Explicit
results are given for z for time reversal symmetric and broken time reversal symmetric systems. Experimental
tests of the theory are presented using data taken from scattering measurements on a chaotic microwave cavity.
DOI: 10.1103/PhysRevE.73.046208 PACS number s : 05.45.Mt, 24.60. k, 42.25.Bs
I. INTRODUCTION
The general problem of externally generated time har-

  

Source: Anlage, Steven - Center for Superconductivity Research & Department of Physics, University of Maryland at College Park

 

Collections: Materials Science