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Summary: Theoretical bounds on a non-raster scan method for tracking string-like
samples
Peter I. Chang and Sean B. Andersson
Department of Mechanical Engineering
Boston University, Boston, MA 02215
{itchang,sanderss}@bu.edu
Abstract-- In this paper, we study the performance
of a non-raster-scan algorithm for imaging string-like
samples in an atomic force microscope. The algorithm
yields high-speed imaging through a feedback control law
that steers the tip along the sample, thereby reducing the
imaging time by eliminating unnecessary measurements.
Under simplifying assumptions, we derive expressions for
bounds on the control parameters to ensure accurate
tracking of the sample.
I. INTRODUCTION
The invention of atomic force microscopy (AFM) in
1986 [1] has led to remarkable discoveries in the field
of nanotechnology, molecular biology and many other
areas. AFM is well suited to probe into the biological
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