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Summary: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 54, NO. 3, JUNE 2005 1241
Environmental-Based Characterization of SoC-Based
Instrumentation Systems for Stratified Testing
N.-J. Park, K. M. George, Nohpill Park, Minsu Choi, Yong-Bin Kim, and Fabrizio Lombardi
Abstract--This paper proposes a novel environmental-based
method for evaluating the good yield rate (GYR) of sys-
tems-on-chip (SoC) during fabrication. Testing and yield eval-
uation at high confidence are two of the most critical issues for
the success of SoC as a viable technology. The proposed method
relies on different features of fabrication, which are quantified by
the so-called Fabrication environmental parameters (EPs). EPs
can be highly correlated to the yield, so they are analyzed using
statistical methods to improve its accuracy and ultimately direct
the test process to an efficient execution. The novel contributions
of the proposed method are: 1) to establish an adequate theoretical
foundation for understanding the fabrication process of SoCs
together with an assurance of the yield at a high confidence level
and 2) to ultimately provide a realistic approach to SoC testing
with an accurate yield evaluation. Simulations are provided to
demonstrate that the proposed method significantly improves
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