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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 52, NO. 6, DECEMBER 2003 1713 Modeling and Analysis of Soft-Test/Repair for
 

Summary: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 52, NO. 6, DECEMBER 2003 1713
Modeling and Analysis of Soft-Test/Repair for
CCD-Based Digital X-Ray Systems
B. Jin, Nohpill Park, Member, IEEE, K. M. George, Minsu Choi, Member, IEEE, and M. B. Yeary, Member, IEEE
Abstract--Modern X-ray imaging systems evolve toward digiti-
zation for reduced cost, faster time-to-diagnosis, and improved di-
agnostic confidence. For the digital X-ray systems, charge coupled
device (CCD) technology is commonly used to detect and digitize
optical X-ray image. This paper presents a novel soft-test/repair
approach to overcome the defective pixel problem in CCD-based
digital X-ray systems through theoretical modeling and anal-
ysis of the test/repair process. There are two possible solutions
to cope with the defective pixel problem in CCDs: one is the
hard-repair approach and another is the proposed soft-test/repair
approach. Hard-repair approach employs a high-yield, expensive
reparable CCD to minimize the impact of hard defects on the
CCD, which occur in the form of noise propagated through A/D
converter to the frame memory. Therefore, less work is needed
to filter and correct the image at the end-user level while it
maybe exceedingly expensive to practice. On the other hand, the

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering