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A maximum-likelihood detection scheme for rapid imaging of string-like samples in atomic force microscopy
 

Summary: A maximum-likelihood detection scheme for rapid imaging of string-like
samples in atomic force microscopy
Peter I. Chang and Sean B. Andersson
Mechanical Engineering, l Boston University, Boston, MA 02215
{itchang,sanderss}@bu.edu
Abstract-- In this paper, we present a sample-detection
scheme designed for non-raster scanning in atomic force mi-
croscopy. The scheme utilizes a maximum-likelihood estimator
applied over a moving window and enables the tracking of a
string-like sample. By tracking, the tip is kept in proximity
to the sample, reducing the total imaging time by eliminating
the measurement of unnecessary information. We combine the
new estimator with previously reported results and apply the
algorithm in simulation to actual data obtained through a
raster-scan image of DNA.
I. INTRODUCTION
Atomic force microscopy (AFM) [1] has led to remarkable
discoveries in the field of nanotechnology, molecular biology,
medicine, materials science and many others. AFM is well
know for its high spatial resolution. Because of this, and its

  

Source: Andersson, Sean B. - Department of Aerospace and Mechanical Engineering, Boston University

 

Collections: Engineering