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SVNY294-Kalinin July 17, 2006 16:18 Principles of Near-Field
 

Summary: P1: GFZ
SVNY294-Kalinin July 17, 2006 16:18
I.7
Principles of Near-Field
Microwave Microscopy
STEVEN M. ANLAGE, VLADIMIR V. TALANOV,
AND ANDREW R. SCHWARTZ
Near-field microwave microscopy is concerned with quantitative measurement of
the microwave electrodynamic response of materials on length scales far shorter
than the free-space wavelength of the radiation. Here we review the basic concepts
of near-field interactions between a source and sample, present an historical intro-
duction to work in the field, and discuss a novel quantitative modeling approach to
interpreting near-field microwave images. We discuss the spatial resolution and a
number of concrete applications of near-field microwave microscopy to materials
property measurements, as well as future prospects for new types of microscopy.
1 Introduction
Much of our understanding of materials comes from studying the interaction of
electromagnetic fields with matter. The optical properties of metals, semiconduc-
tors, and dielectrics have revealed many aspects of charge and lattice dynamics in
condensed matter and the study of materials at lower frequencies has also been

  

Source: Anlage, Steven - Center for Superconductivity Research & Department of Physics, University of Maryland at College Park

 

Collections: Materials Science