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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 54, NO. 3, JUNE 2005 1033 Automated Selection of Test Frequencies for Fault
 

Summary: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 54, NO. 3, JUNE 2005 1033
Automated Selection of Test Frequencies for Fault
Diagnosis in Analog Electronic Circuits
Cesare Alippi, Senior Member, IEEE, Marcantonio Catelani, Ada Fort, Member, IEEE, and Marco Mugnaini
Abstract--This paper suggests three novel methods for selecting
the frequencies of sinusoidal test signals to be used in fault diag-
nosis of analog electronic circuits. The first and second methods
are based on a sensitivity analysis and show to be particularly
effective in linear circuits where a priori information and de-
signer experience can be exploited. Conversely, the third method
selects the input frequencies to be used for diagnostic purposes
without requiring any hypothesis about the circuit or testing
design background. As such, the method is particularly appealing
in complex--possibly nonlinear--circuits where the designer
experience is of little value and an effective "blind" approach saves
both designer and testing time. The suggested frequency selection
methods are then contrasted to each other against performance
and computational complexity.
Index Terms--Analog circuit diagnosis, test frequency selection.
I. INTRODUCTION

  

Source: Alippi, Cesare - Dipartimento di Elettronica e Informazione, Politecnico di Milano

 

Collections: Computer Technologies and Information Sciences