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Surface Review and Letters, Vol. 5, No. 6 (1998) 12571268 c World Scientific Publishing Company
 

Summary: Surface Review and Letters, Vol. 5, No. 6 (1998) 12571268
c World Scientific Publishing Company
A FREE ELECTRON LASER PHOTOEMISSION ELECTRON
MICROSCOPE SYSTEM (FEL PEEM)
H. ADE,
W. YANG,
S. L. ENGLISH,
J. HARTMAN,
R. F. DAVIS
and R. J. NEMANICH
Department of
Physics and
Engineering, NCSU, Raleigh, NC 27695, USA
V. N. LITVINENKO, I. V. PINAYEV, Y. WU and J. M. J. MADEY
FEL Laboratory, Department of Physics, Duke University, Durham, NC 27708, USA
Received 16 June 1998
We report first results from our effort to couple a high resolution photoemission electron microscope
(PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4 / Duke UV FEL). The
OK-4 / Duke UV FEL is a high intensity source of tunable monochromatic photons in the 310 eV
energy range. This tunability is unique and allows us to operate near the photoemission threshold of

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics