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The continuous exponential growth in transistors per chip as described by Moore's
 

Summary: 70
The continuous exponential growth
in transistors per chip as described by Moore's
law has spurred tremendous progress in the
functionality and performance of semicon-
ductor devices, particularly microprocessors.
At the same time, each succeeding technolo-
gy generation has introduced new obstacles
to maintaining this growth rate. Transient
faults caused by single-event upsets have
emerged as a key challenge likely to gain sig-
nificantly more importance in the next few
design generations.
Techniques for dealing with these faults
exist, but they come at a cost. Designers need
accurate soft-error estimates early in the design
cycle to weigh the benefits of error protection
techniques against their costs. This article pre-
sents a method for generating these estimates.
Soft-error sources and impact

  

Source: Austin, Todd M. - Department of Electrical Engineering and Computer Science, University of Michigan

 

Collections: Engineering; Computer Technologies and Information Sciences