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Multiple Stuck-at Fault Diagnosis in Logic Circuits Youns KARKOURI, El Mostapha ABOULHAMID
 

Summary: ­ 1 ­
Multiple Stuck-at Fault Diagnosis in Logic Circuits
Younès KARKOURI, El Mostapha ABOULHAMID
Dép. d'informatique et de recherche opérationnelle
Université de Montréal, C.P. 6128, Succ. "A"
Montréal, (Québec), H3C-3J7, Canada.
ABSTRACT
A new method to fault diagnosis in combinational circuits is
presented. We consider multiple stuck-at-(0/1) faults at the gate
level. We introduce the concept of frontier faults which reduce
the number of faults to consider and are equivalent to the set of all
multiple faults; however, we do not enumerate all the possible
multiple faults. The diagnosis is performed in two consecutive
steps. Forward propagation that determines, for each line in the
circuit, its fault free value and the potential effect(s) from other
faulty lines that can propagate to it. Backward implication is
performed from the primary outputs toward the primary inputs
and determines, given the circuit response, the value(s) carried by
each line. Some of the deduced values imply that either the line is
not faulty, the subnetwork driving the line contains fault(s), or the

  

Source: Aboulhamid, El Mostapha - Département d'Informatique et recherche opérationnelle, Université de Montréal

 

Collections: Engineering