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Summary: 1 October, 1999
Liquid Titanium Solute Diffusion Measured by Pulsed Ion-Beam Melting
P. G. Sanders, M. O. Thompson1
, T. J. Renk2
, and M. J. Aziz
Division of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138
1
Materials Science and Engineering Department, Cornell University, Ithaca, NY 14853
2
Sandia National Laboratories, Albuquerque, NM 87185
Abstract
The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting
of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were
employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth
profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the
range of 5 to 9 x 10-5
cm2
/s were determined at temperatures in the range of 2200 to 2500 K. Calculations
of buoyancy and Marangoni convection indicate that convective contamination is unlikely.
Introduction
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