Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
Learning Acyclic Probabilistic Circuits Using Test Paths Dana Angluin1
 

Summary: Learning Acyclic Probabilistic Circuits Using Test Paths
Dana Angluin1
and James Aspnes1,
and Jiang Chen2,
and David Eisenstat3
and Lev Reyzin1,
1
Computer Science Department, Yale University
{angluin,aspnes}@cs.yale.edu, lev.reyzin@yale.edu
2
Yahoo! Inc., 701 First Avenue, Sunnyvale, CA 94086
criver@gmail.com
3
eisenstatdavid@gmail.com
Abstract
We define a model of learning probabilistic acyclic
circuits using value injection queries, in which an
arbitrary subset of wires is set to fixed values, and
the value on the single output wire is observed.
We adapt the approach of using test paths from

  

Source: Aspnes, James - Department of Computer Science, Yale University

 

Collections: Computer Technologies and Information Sciences