Summary: Learning Acyclic Probabilistic Circuits Using Test Paths
Dana Angluin1
and James Aspnes1,
and Jiang Chen2,
and David Eisenstat3
and Lev Reyzin1,
1
Computer Science Department, Yale University
{angluin,aspnes}@cs.yale.edu, lev.reyzin@yale.edu
2
Yahoo! Inc., 701 First Avenue, Sunnyvale, CA 94086
criver@gmail.com
3
eisenstatdavid@gmail.com
Abstract
We define a model of learning probabilistic acyclic
circuits using value injection queries, in which an
arbitrary subset of wires is set to fixed values, and
the value on the single output wire is observed.
We adapt the approach of using test paths from

Source: Aspnes, James - Department of Computer Science, Yale University

Collections: Computer Technologies and Information Sciences