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Lateral interface anisotropy in nanomagnets R. P. Cowburn,a)

Summary: Lateral interface anisotropy in nanomagnets
R. P. Cowburn,a)
D. K. Koltsov, A. O. Adeyeye, and M. E. Welland
Nanoscale Science Laboratory, Department of Engineering, University of Cambridge, Trumpington Street,
Cambridge CB2 1PZ, United Kingdom
The results are presented of a study into the magnetic properties of deep submicron elliptical
nanomagnets. Small arrays of 2:1 aspect ratio ellipses of major axis size 500100 nm and of
thickness 510 nm have been fabricated out of supermalloy. A high sensitivity magneto-optical
method has then been used to measure the hysteresis loops of each array. From these measurements
the effective shape anisotropy in the elongated elements can be accurately determined. The
measured shape anisotropy is found to be significantly smaller approximately 50% than that which
would be expected from standard magnetostatic calculations. It is shown experimentally and
theoretically that lateral interface i.e., edge roughness of only a few nanometers, which is present
in any real nanomagnet, leads to the appearance of a powerful anisotropy of magnetostatic origin
which competes strongly with the in-plane shape anisotropy, thus accounting for the anomalously
low experimental values. The significance of this for data stability in magnetic random access
memory is discussed. 2000 American Institute of Physics. S0021-8979 00 49708-2
Interfaces are places where some of the richest science
can be found, be it the two-dimensional electron gas formed


Source: Adeyeye, Adekunle - Department of Electrical and Computer Engineering, National University of Singapore


Collections: Physics; Materials Science