Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate con-
 

Summary: Abstract
To excite a stuck-open fault in a CMOS combinational
circuit, it is only necessary that the output of the gate con-
taining the fault takes on opposite values during the applica-
tion of two successive input vectors to the primary inputs of
the circuit. In this paper we formulate the excitation problem
as an ILP instance and use two advanced ILP solvers, one is
Boolean satisfiability (SAT)-based and the other is generic,
to search for a pair of input vectors that maximizes the si-
multaneous excitation of as many stuck-open faults in the
circuit as possible. The proposed approach was tested using
benchmarks from the ISCAS 89 suite of circuits. Experimen-
tal results indicate that fault-excitation, within a reasonable
CPU time limit, is possible in most cases.
1. Introduction
To review the problem of detecting FET stuck-open
faults in CMOS gates, consider the circuit diagram of the 2-
input NOR gate shown in Figure 1. Assume the existence of
an open circuit on the N2 transistor. Input condition
and should pull the output node to logic 0 value; but

  

Source: Aloul, Fadi - Department of Computer Engineering, American University of Sharjah

 

Collections: Engineering