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Journal of the Mechanics and Physics of Solids 48 (2000) 23152332
 

Summary: Journal of the Mechanics and Physics of Solids
48 (2000) 2315­2332
www.elsevier.com/locate/jmps
Mode-dependent toughness and the
delamination of compressed thin films
B. Audoly *
Laboratoire de Physique Statistique de l'E´cole Normale Supe´rieure, associe´ au CNRS,
24 rue Lhomond, F-75231 Paris Cedex 05, France
Received 2 August 1999; received in revised form 21 December 1999
Abstract
We consider the buckle-driven delamination of compressed thin films. For a wide class of
patterns of delamination, it is shown that the loading on the delamination front progressively
goes from mode I to mode II during growth of the blister. As a result, the mode dependence
of the film/substrate interface excludes widespread delamination. This explains the obser-
vations of blisters of finite extent, which are otherwise difficult to interpret. We also study a
model of interfacial fracture with friction. It reveals that a severe mode dependence can be
induced by interfacial friction. This permits us to account for the mode dependence using only
simple ingredients: friction and linear elasticity. © 2000 Elsevier Science Ltd. All rights
reserved.
Keywords: A. Delamination; B. Plates; C. Stability and bifurcations; B. Friction

  

Source: Audoly, Basile - Institut Jean Le Rond D'Alembert, Université Pierre-et-Marie-Curie, Paris 6

 

Collections: Materials Science; Physics