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Characterization of two-dimensional colloidal polycrystalline materials using optical diffraction
 

Summary: Characterization of two-dimensional colloidal
polycrystalline materials using optical diffraction
Ivan Avrutsky, Bing Li, and Yang Zhao
Department of Electrical and Computer Engineering, Wayne State University, Detroit, Michigan 48202
Received July 19, 1999; revised manuscript received November 23, 1999
We present an optical-diffraction method for quantitative characterization of two-dimensional colloidal poly-
crystalline materials. From the angular-diffraction profile we can estimate both the average size of the crys-
talline grain and the defect density within the grains. Our statistical diffraction model shows that the dif-
fraction line shape is close to a Lorentzian profile if a lot of defects exist within a grain, and it becomes close to
Gaussian if the grains are essentially free of defects. This method is used for analyzing the quality of poly-
styrene colloidal crystals produced by the evaporation technique. The results are compared with direct sta-
tistical analysis of microscope images. 2000 Optical Society of America [S0740-3224(00)00906-1]
OCIS codes: 050.1940, 050.2770, 070.2590.
1. INTRODUCTION
Colloidal crystals are naturally suitable for constructing
two-dimensional (2-D) and three-dimensional gratings
(photonic crystals) that can provide optical bandgap in ul-
traviolet, visible, and near-infrared wavelength ranges.
The photonic crystals can confine the photons of light
in certain frequency bands, control spontaneous emis-

  

Source: Avrutsky, Ivan - Department of Electrical and Computer Engineering, Wayne State University

 

Collections: Engineering