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EEE lnsmmentarionand Measurement Technology Conference
 

Summary: EEE lnsmmentarionand Measurement
Technology Conference
Veil. CO, USA. May 20-22.2003
Soft-Test/Repairof CCD-basedDigital X-Ray Instrumentation
B. Jin, N. Park+,K.M. George
Departmentof Computer Science
Oklahoma StateUniversity, Stillwater, OK 74078-1053
{byoungj,npark.kmg} @cs.okstate.edu
M. Choi
Departmentof Electrical and Computer Engineering
University of Missouri-Rolla, Rolla. MO 65409-0040
choim@um.edu
M.Yeary
Departmentof Electrical and Computer Engineering
University of Oklahoma, Norman, OK 73019-1023
yeary@ou.edu
Y.B. Kim
Departmentof Electrical and Computer Engineering
Northeastern University, Boston, MA 02115
ybk@ece.neu.edu

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering