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Crystallization in the Thin and Ultrathin Films of Poly(ethylene-vinyl acetate) and Linear Low-Density Polyethylene
 

Summary: Crystallization in the Thin and Ultrathin Films of Poly(ethylene-vinyl
acetate) and Linear Low-Density Polyethylene
Y. Wang, S. Ge, M. Rafailovich,*, J. Sokolov, Y. Zou, H. Ade, J. Lu1 ning,
A. Lustiger, and G. Maron#
Department of Materials Science and Engineering, State University of New York at Stony Brook,
Stony Brook, New York 11794; Department of Physics, North Carolina State University,
Raleigh, North Carolina 27695; Stanford Synchrotron Radiation Lab, Stanford, California 94209;
ExxonMobil Research and Engineering Company, Annandale, New Jersey 08801; and Department of
Applied Chemistry, The Hebrew University of Jerusalem, Jerusalem 91904, Israel
Received August 29, 2003
ABSTRACT: The crystallization of poly(ethylene-vinyl acetate) and linear low-density polyethylene
(LLDPE) films spun-cast from the polymer/toluene solutions with as-cast thickness from 460 to 10 nm
was studied. The lamellar thickness was measured using small-angle X-ray scattering (SAXS) and found
to increase from 14 to 21 nm for films thinner than 100 nm. The morphology of LLDPE measured by
scanning probe microscopy (SPM) showed an edge-on lamellae for the films thicker than 30 nm and flat-
on lamellae for the films thinner than 15 nm. A pseudo-"shish-kebab" tiny crystal structure was observed
in between the larger lamellae. Crystallinity was confirmed using attenuated total reflectance-Fourier
transformed infrared spectroscopy (ATR-FTIR) and near-edge X-ray absorption fine structure (NEXAFS)
spectroscopy. The shear modulation force microscopy technique (SMFM) was used to measure the melting
point, Tm, which was found to decrease for films thinner than 100 nm. The rate of decrease was a function

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics