Summary: Parameterizing Random Test Data According to
Equivalence Classes
Christian Murphy
Dept. of Computer Science
Columbia University
New York, NY
cmurphy@cs.columbia.edu
Gail Kaiser
Dept. of Computer Science
Columbia University
New York, NY
kaiser@cs.columbia.edu
Marta Arias
Center for Computational Learning
Systems
Columbia University
New York, NY
marta@ccls.columbia.edu
ABSTRACT
We are concerned with the problem of detecting bugs in machine

Source: Arias, Marta - Departament of Llenguatges i Sistemes Informátics, Universitat Politècnica de Catalunya

Collections: Computer Technologies and Information Sciences