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Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films
 

Summary: Imaging three-dimensional polarization in epitaxial polydomain
ferroelectric thin films
C. S. Ganpule,a)
V. Nagarajan, B. K. Hill, A. L. Roytburd, E. D. Williams,
and R. Rameshb)
Materials Science Research and Engineering Center, University of Maryland, College Park, Maryland 20742
S. P. Alpayc)
Department of Metallurgy and Materials Engineering, University of Connecticut, Storrs, Connecticut 06269
A. Roelofs and R. Waser
Institut fušr Werkstoffe der Elektrotechnik, RWTH Aachen, D-52056 Aachen, Germany
L. M. Eng
Institut fušr Angewandte Photophysik, Technische Universitašt Dresden, D-01062 Dresden, Germany
Received 13 June 2001; accepted for publication 1 October 2001
Voltage-modulated scanning force microscopy Piezoresponse microscopy is applied to investigate
the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on 001 SrTiO3. By
monitoring the vertical and lateral differential signals from the photodetector of the atomic force
microscope it is possible to separate out and observe the out-of-plane and in-plane polarization
vectors in the thin film individually. The relative orientation of the polarization vectors across a 90°
domain wall is observed. Nucleation of new reversed 180° domains at the 90° domain wall is
studied and its impact on the rotation of polarization within the a domain is analyzed as a function

  

Source: Alpay, S. Pamir - Department of Materials Science and Engineering, University of Connecticut

 

Collections: Materials Science