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Spectral self-interference fluorescence microscopy L. Moiseev and C. R. Cantor

Summary: Spectral self-interference fluorescence microscopy
L. Moiseev and C. R. Cantor
Center for Advanced Biotechnology, 36 Cummington St. 2nd Floor, Boston, Massachusetts 02215
M. I. Aksun
Department of Electrical and Electronics Engineering, Koç University, Istanbul, Turkey
M. Dogana)
and B. B. Goldberg
Department of Physics, Boston University, 590 Commonwealth Ave., Boston, Massachusetts 02215
A. K. Swan and M. S. Ünlü
Department of Electrical and Computer Engineering, Boston University, 8 Saint Mary's Street, Boston,
Massachusetts 02215
(Received 18 March 2004; accepted 30 June 2004)
Spontaneous emission of fluorophores located close to a reflecting surface is modified by the
interference between direct and reflected waves. The spectral patterns of fluorescent emission near
reflecting surfaces can be precisely described with a classical model that considers the relative
intensity and polarization state of direct and reflected waves depending on dipole orientation. An
algorithm based on the emission model and polynomial fitting built into a software application can
be used for fast and efficient analysis of self-interference spectra, yielding information about the
location of the emitters with subnanometer precision. Spectral information was used to study thin
films of fluorescent substances on surfaces. © 2004 American Institute of Physics.


Source: Aksun, M. Irsadi - Electrical and Electronics Engineering, Koc University
Goldberg, Bennett - Department of Physics, Boston University


Collections: Engineering; Physics