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September 15, 1990 / Vol. 15, No. 18 / OPTICS LETTERS 1035 Information erasing in the phenomenon of long-lived photon
 

Summary: September 15, 1990 / Vol. 15, No. 18 / OPTICS LETTERS 1035
Information erasing in the phenomenon of long-lived photon
echo
N. N. Akhmediev
Institute of Physical Problems, Moscow 103460, USSR
Received February 20, 1990; accepted April 22, 1990
The possibility oferasing information in an arbitrary cellofan optical memorydevicebased onthe phenomenon of
long-lived photon echo is theoretically considered. Optimal conditions for a maximal number of write-erase cycles
in a given cell are obtained, and an experimental setup for observing this effect is proposed.
The phenomenon oflong-lived photon echo (LPE) has
recently attracted much attention.'- 8 This interest
stems from the possible application of this phenome-
non in high-capacity optical memory devices9'10
(OMD's). The LPE phenomenon allowsus to realize
practically all functions ofon-line nonarchival OMD's:
high-capacity, high-speed read-write functions, etc.
Moreover, it allowsus to writeimages,4 to obtain phase
conjugation at readout,5 and to write and read com-
posite pulse envelopes.6' 7"10
At present many problems crucial to the construc-

  

Source: Akhmediev, Nail - Research School of Physical Sciences and Engineering, Australian National University

 

Collections: Physics; Engineering