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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 52, NO. 6, DECEMBER 2003 1749 Analysis and Measurement of Timing Jitter Induced
 

Summary: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 52, NO. 6, DECEMBER 2003 1749
Analysis and Measurement of Timing Jitter Induced
by Radiated EMI Noise in Automatic Test Equipment
Y. J. Lee, Student Member, IEEE, T. Kane, Member, IEEE, J.-J. Lim, Student Member, IEEE,
L. Schiano, Student Member, IEEE, Y.-B. Kim, Senior Member, IEEE, F. J. Meyer, Member, IEEE,
F. Lombardi, Senior Member, IEEE, and S. Max, Senior Member, IEEE
Abstract--This paper deals with the generation, measure-
ment and modeling of the jitter encountered in the signals of
a testhead board for automatic test equipment (ATE). A novel
model is proposed for the jitter; this model takes into account the
radiated electromagnetic interference (EMI) noise in the head of
an ATE. The RMS value of the jitter is measured at the output
signal of the testhead board to validate the proposed model. For
measuring the RMS value, a novel circuitry has been designed on
a daughter board to circumvent ground noise and connectivity
problems arising from the head environment. An H-field is
applied externally at the loop filter of a phase-locked loop (PLL),
thus permitting the measurement of the RMS jitter to verify the
transfer function between radiated EMI and jitter variation. The
error between measured and predicted jitters is within a 15%

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering